• Yield Learning

    Yield learning is challenged by the need for outstanding data analysis tools as well as accurate and timely underlying data. Analysis tools need to be able to measure long term trends over many lots as well as monitor short term trends on-line.

    Wafer Yield

Our Strength

Yield Learning shares a common solution set with the following concepts:

  • Time-to-volume
  • Time-to-market
  • New product introduction (NPI)
  • Yield learning

Whatever your organization calls it, success involves many aspects of semiconductor operations. Back-end test and assembly operations play an important role.

All the data, all the time

First, test results are the ultimate measure of yield. Your data needs to be accurate and timely for upstream analysis tools to make good use of it. Salland offers powerful solutions to help in the data collection process. Our on-line data collection products minimize your "time to information."

On-line Monitoring Solutions

Real-time trend monitoring during production can detect problems in your test processes before they cause costly issues. Salland offers a number of on-line solutions that support user-definable alerts and actions.

  • SwifTest-MAX is a software-only solution that runs transparently on your ATEs.
  • Test Cell Controllers monitor both the tester and the prober/handlers on-line. Test cell controllers are the most effective means for maximizing your data integrity and optimizing production throughput.
  • TestScape is a modular, highly scalable, enterprise-wide, test data management system. TestScape is an easy-to-use, on-line, web-based system that supports complete yield analysis and real-time monitoring as well optional modules for OEE, SPC and other critical test process improvements. TestScape provides users with a web-based, common view of test data across different brands of testers, different product types and different test floors in near-real-time.

Data Analysis Tools

Salland offers several outstanding data analysis tools depending upon your budget and the specific issues you are trying to solve. All offer exceleltn yiel analysis capabilities.

  • SEDana is a low cost, yet powerful test data analysis tool for engineers on a limited budget. Users can quickly review statistical analysis results and benefit from the Gauge R&R functionality.
  • TestScape-AWARE is an on-line test data management system used for comprehensive yield analysis, ANOVA and test monitoring. TestScape provides users with a web-based, common view of test data across different brands of testers, different product types and different test floors in near-real-time.
  • TestScape-Optimize is an on-line test data management system used to develop optimized test plans for reducing test time or eliminating outliers using Salland's adaptive test solutions. When applying outlier detection, the tool assists the engineer to avoid unnecessary yield loss.
  • TestVision is a desktop analysis tool used to develop optimized test plans for reducing test time or eliminating outliers using Salland's adaptive test solutions while minimizing yield loss.