On-line Test Time Optimization for Functional Patterns and Parametric Tests
SwifTest-TTO is our premier real-time adaptive test solution that has helped save millions of dollars annually for demanding world-class customers like Qualcomm and Texas Instruments. Based on Pintail’s Real-time Adaptive Test technology, the solution has proven effective in reducing test time on both functional patterns and parametric testing within user-defined quality levels.
In addition to the patented algorithms developed by Pintail over years of collaboration with our key customers, SwifTest-TTO now enables users to easily add their own optimization algorithms via simple Java files. SwifTest-TTO is essentially an adaptive engine that can dynamically adjust test coverage to the exact conditions of the silicon under test. The recipe for this optimization is defined by the user based upon both historical production results and real-time measurements.
It can be deployed at both wafer probe and final test. It is effective on a wide range of device types including:
- Complex SOCs
- Wireless and RF devices
- Interface devices
- Power management devices
- Data converters
- Analog/Linear devices
- Reduces test time and cost by 30%
- Users may add their own algorithms
- Maintains user-defined quality levels
- Effective at both probe and final test
- Powerful off-line analysis and simulation
- Easy to implement
- Rapid return on investment (ROI)
- Non-intrusive integration with test operations
- Available for most leading ATEs
- Supported at most test subcons
- Effective across a wide variety of mixed signal devices
- Proven in production with tens of millions of items shipped
The real-time advantage
SwifTest-TTO operates at a highly granular level, making real-time decisions after every independent test on a device-by-device basis. Unlike traditional post-processing techniques, SwifTest-TTO suppresses only those tests within a test program that are adhering to the user-defined criteria for sampling. These criteria may be complex combinations of real-time measurements, e.g. while Cpk > 1.67 and Fmax >4GHz.
Immediate notification can be provided through triggers and alerts of production issues related to test program stability, ATE operations and maverick lots. Real-time, temporary suppression of tests that are in statistical control achieves a more optimal balance of time versus quality than possible using traditional manual optimization techniques. The result is shorter test time that reduces cost of test and improves product margins.
Off-line analysis and simulation
A powerful set of off-line analysis and simulation tools allows the user to determine the optimal test plan for a device before releasing it to production. With a real-time sampling plan that is easy to set up and implement, SwifTest-TTO will improve test throughput even if for test program where extensive optimization has already been applied.
Built-in flexibility
SwifTest-TTO is unique in that it is equally effective at wafer probe and final (packaged) tests. It supports single-site, multi-site, and dual-head configurations. In addition, the product is highly configurable by the user to ensure that sampling criteria meet corporate standards for quality assurance and DPPM rates.
Proven in production
SwifTest has been installed on over 500 production ATE systems in over a dozen factories throughout the world. Hundreds of millions of devices have been successfully shipped by industry leaders with dramatically lower test times. SwifTest-TTO is available for most leading testers. SwifTest-TTO has also proven to be easy to install, non-intrusive to test operations and local IT administrators, and robust enough for the most demanding IDMs and third-party test services in the industry.
Over 1 Billion Devices Shipped as of 1Q08
“Texas Instruments has been using SwifTest-TTO to reduce test time at both probe and final test for several years”
José Ramon, Operations Engineering Manager for TI's Technology & manufacturing Group.
