The Most Trusted Adaptive Test Platform
The SwifTest product family consists of several optionally licensed modules for performing a wide variety of on-line adaptive test functions. SwifTest has been used in volume production on hundreds of testers and over 1 billion devices since 2004. SwifTest-AMX is a major upgrade that streamlines its overall performance and allows users to add their own algorithms for controlling test flows, outlier extraction or other on-line test strategies.
The following diagram illustrates the product configurations available for this on-line suite of software.
SwifTest-AMX is the Advanced Monitoring Executive (formerly known as SwifTest-Manager) that is a pre-requisite module for all of the SwifTest product options. As a standalone module it is used to capture data in real-time from the tester and transmit it to a database system like Pintail’s TestScape. Standard functions included with SwifTest-AMX are:
- RTDP – the Real-time Data Port accepts test data in various formats including STDF and translates it into a common format used by SwifTest for it adaptive test functions.
- iLOG Writer is the output port that sends test data to a database system like Pintail’s TestScape.
- RPG is the report generator that prepares and emails alerts and lot summaries.
- SCI is the SwifTest Command interface that allows signaling between an external, off-line application and SwifTest. This is useful for feed-forward or feed-back adaptive test algorithms.
- CCI – is a future interface for test cell controllers that will enable SwifTest routines to control handlers and probers via an on-line test cell controller and exchange information regarding job control with cell controllers like Salland’s SEProbe™.
SwifTest-TTO is Pintail’s Test Time Optimization module. This popular product performs real-time, statistical test flow optimization to reduce cost of test. It adaptively increases or decreases test coverage based upon the quality and yield of the current device under test (DUT) and its associated lot. Flow optimization for a specific test may be controlled by the statistical performance of another test or group of tests. It is effective on both parametric tests as well as functional patterns. It is effective at both wafer probe and final (packaged) test. It is well proven to reduce cost of test without degrading reliability or quality. New with SwifTest_TTO is the capability for users to easily program their own optimization algorithms.
SwifTest-FOX is Pintail’s Fast Outlier Extraction tool. FOX performs on-line as well as post-processing outlier detection based upon very sophisticated algorithms developed by Pintail and also licensed from Avago Technologies. This tool is effective for increasing device reliability or for reducing the cost of burn-in and may be used at both wafer probe and final (packaged) test. New with SwifTest-FOX is the capability for users to easily program their own outlier detection and rejection algorithms.
SwifTest-MAX contains Monitoring Actions in the form of Triggers and Alerts. Sophisticated monitoring actions can be easily scripted to improve operator efficiency or to optimize retest strategies, etc. New with SwifTest-MAX is the capability for users to easily program their own triggers and alerts and trigger-actions.
SwifTest-DTI is a new optional product available for the SwifTest platform. This Dynamic Test Interface is used to support a variety of miscellaneous adaptive test algorithms that don’t fall neatly under monitoring, test time optimization or outlier detection. Examples include Pintail’s new Dynamic Site-site Calibration (DSC) which can automatically correct certain forms of site-site variation on the fly and thus recover test yield losses. Users can develop their own algorithms that plug into this interface.
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