Transferring Round Maps to Square Holes?

Features

Salland Engineering's MapWareHouse has been proven in demanding production environments over several years. MapWareHouse delivers the unique features required to meet today's challenges of managing wafer map information. It provides a common database for collecting map data in a central location accessible by any internal or authorized external organization. Although maps are converted to a common format, the original map data is retained as well for complete audit trail purposes.

MapWareHouse provides easy to use, basic analysis and editing tools specifically designed for production personnel. In organizations that have limited data analysis tools, MapWareHouse delivers basic analysis functionality necessary in any modern testing environment. For companies already invested in full yield management tools, MapWareHouse serves as a compatible addition that is easier to use for production purposes. Its ability to create common formats of potentially partial map data makes it a good frontend data processor for existing infrastructures.

Block Diagram

The following figure highlights the architecture of the MapWareHouse solution. There are three primary modules plus an interface to enable interfacing the system to other enterprise systems. MapConvert allows the user to directly transfer maps from standard file systems upon demand. MapScan provides an automated way for continuously loading completed maps as they arrive in one or more directories into the centralized database. In all cases, MapEdit provides powerful editing features as well as basic data analysis fundamental to managing on-line production results.

Benefits

Customers already using MapWareHouse have reported significant return on investment as shown in the following table. By maximizing data integrity and by minimizing data conversion and exchange issues, throughput can be increased and work in process can be decreased. In high quality applications like automotive, MapWareHouse not only helps improve quality of test with ULPY algorithms, but adds tracking information required by customers to correlate field failures to early die information. Finally, having all the data organized for easy access provides broad productivity improvements for everyone throughout the organization who needs to manage and manipulate wafer data.