• Dynamic Testcell Controllers

    Since 1999, Salland has delivered over 2000 copies of SE-PROBE - the foundation module for our popular Dynamic Testcell Controller (DTC)  for wafer sort. 

    Cell Controller Collage

Aggressive Speed, Cautious Monitoring

An essential part of any modern semiconductor test floor is the test cell controller, also known as test cell optimizers or test station controllers. This product provides a common link between the tester and equipment like the probers or handlers. The cell controllers provide the following essential services:

  1. A communications link between different equipment types that lack consistent data formats.
  2. An on-line monitoring capability to detect abnormal results in real-time.
  3. A data collection facility that improves data quality by intelligent integration of operator actions with results from the tester and with results from the prober/handler.
  4. Software that can actually speed up cell throughput by sending controls to the prober/ handlers that comprehend test results and trends in the tester in real-time.
  5. Software tools that assist operations with insuring good setup.

Salland is a world leader in providing test cell controllers to the industry. Our workhorse product, the DTC-WS has been in production since 1999 and currently boasts an installed base of over 2000 systems.

Dynamic Test Cell for Wafer Sort (DTC-WS)