Yield Learning (Ramp) is the time from initial product yield to volume product yield. It is a critical measurement used in discussing the need by semiconductor manufacturers to get their new designs into volume production faster. Semiconductor product introduction requires the yield qualification of an IC before manufacturing. Since IC’s do not have high initial yield, a process of yield improvement is required. The obvious benefit to semiconductor manufacturers is to accelerate time to market and reduce cost.
Key challenges during this phase include:
- Rapid identification of yield issues.
- Comprehensive diagnostics that can identify specific solutions at the sub-die level.
- On-going monitoring that assures continuing yield improvement without adding costly overhead to volume manufacturing, such as increased test time, handling, etc.
Pintail’s SwifTest-YL™ (for Yield Link™)can serve as the foundation for numerous yield learning solutions. Pintail is actively working with leading providers of electronic design automation tools who can create highly sophisticated solutions to this challenge, using the real-time data and adaptive control offered by Pintail’s technology.
Client Resources
Login Required
Click here to login now.
