Product Overview

Data Analysis Solutions

• Real-time Data Dashboard
• Adaptive Test Analysis
• Device Characterization
• Redundancy Analysis

Real Time Adaptive
Test Solutions

• Real-time Monitoring
• Outlier Detection and Rejection
• Test Time Optimization
• Dynamic Test Interface
• Yield Link Data Interface

Test Operations Solutions

• Real-time OEE and LCM
• Statistical Process Control

Meeting Your Needs

• Cost of Test
• Extreme Quality & Reliability
• Yield Learning and NPI
• Test Operations
• Working with Subcons

Making Your Job Easier

• Test & Product Engineers
• Test Operations Managers
• Yield Engineers
• Quality Engineers
• Product Line Managers
• Software Developers

Company Information

Cost of Test Is Still a Top Challenge
2007 International Technology Roadmap for Semiconductors

If cost of test is your number one issue, Pintail’s real-time technology provides some of the most powerful solutions in the industry today:

• Analysis of Test Processes
  Fundamental to reducing cost of test starts with having a good knowledge of your test processes. This is obtained using the off-line analysis of real production data. Pintail’s offers several powerful analysis tools. For example, TestVision is a low cost, PC-based tool ideal for using in the field, especially when access to corporate databases may be limited.
• Analysis of Test Program Redundancy
  reduTec is a powerful, PC-based tool that can quickly analyze large volumes of data in order to determine the optimum test plan for a device by identifying redundant tests. Both TestVision and reduTec have simulation capabilities that are used to prepare test plans for Pintail’s on-line test time optimization.
• Test Time Reduction
  Leading semiconductor manufacturers have shown that Pintail’s adaptive test can be used to accelerate test time without jeopardizing quality. Compared to alternative methods, the Pintail solution provides a higher level of quality control due to our real-time, adaptive algorithms. Our customers can reduce unit cost and improve output rates without additional, expensive capital investments or changes to their chip design. See SwifTest-TTO.
• Real-time Monitoring
  The faster you run your test lines, the faster you can waste test time and create scrap by making mistakes that cannot be caught. SwifTest-AMX catches issues immediately and can alert test operators and product engineers about what needs to be corrected, effectively reducing your cost of test.
• Minimized Retest
  The cost of retest is reported as one of the top challenges facing test operations today. SwifTest-AMX can be used to implement intelligent retest strategies that reduce test time, reduce handling errors and improve yield.
• Faster Time to Information
  Obviously, obtaining information faster helps everyone involved in semiconductor testing to save time and money. Pintail’s SwifTest on-line monitoring combined with TestScape offer the industry’s most comprehensive solution for reducing the time to information.

Client Resources
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Find out how Qualcomm used Pintail Technologies’ SwifTest-AMX™ and SwifTest-TTO™ to significantly reduce cost of test and increase margins.
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