A Real-Time Test Floor Dashboard for Engineers
TestScape is a versatile, web-based DBMS solution that automatically collects in real-time the output from the SwifTest monitoring system and allows users to “slice and dice” the data from any web browser in the world. TestScape solutions provide an additional level of real-time data acquisition and analysis by making information available before the next lot starts processing.
- Ultra fast identification of test issues
- Easy to deploy, learn and use
- In-depth yield analysis by device, by lot, by equipment, etc.
- Dashboard continuously mines data and highlights unwanted variances
- PCM correlation, test to test scatter diagrams and test capacity charts
- May be configured for on-line data analysis or off-line analysis of data logs
- Supported across the supply chain
TestScape-Aware, a configuration of TestScape, is used by Test and Product Engineers to quickly resolve test problems, identify test process improvement needs, react to maverick lots and drill down to discover the root causes of throughput and quality issues in near-real-time.
Example: Product Dashboard
Example: Drill-down to Test Details
Example: Multi-site Histograms
Example: Multi-site Variance Analysis
Example: Advanced Wafer Maps
Improved yield analysis
TestScape-Aware provides an intuitive user interface that displays yield summaries by lot, by product, lot grouping, hardware and software binning analysis, analysis by tester, binning and yield analysis by site and by test.
Streamlined product management
Users can quickly identify low yielding lots, process drift, and view alerts within seconds. Lot summaries produced by the SwifTest monitoring system can be viewed from TestScape-Aware at any time, using a standard web browser. Engineers can view tester activity over the selected time frame by product or by lot class, including first retest, correlation, and engineering.
Powerful test statistical metrics
Test process control charts show Cp, Cpk, and Mean for selected tests across the selected lots. User can also view and navigate from a Pareto analysis of all available parametric tests with Cpk below 2.
Wafer mapping and analysis
TestScape-Aware provides detailed yet easy-to-read mapping in 2D and 3D formats that present yield, binning, retest, stacked wafer, multi-wafer, and multi-lot graphics.
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"The biggest surprise has been the SPEED. It is very fast at pinpointing specific issues across a vast amount of data. Being able to see your worldwide production in real-time from anywhere on the Internet is an awesome feeling."
Andrew Bruno
Director of Test Engineering
Power Integrations, Inc
www.powerint.com
