Plan and Simulate Predicted Results of Adaptive Test
- Identify optimum test plan for sampling
- Identify best tests for outlier extraction
- Recommends best operating points for adaptive test
- Graphical presentation of test trends across lots
- Able to process many lots of data
- Helps user prepare Device Profile for SwifTest
- Easy to use, no cost to Pintail customers
TestVision/6® is a desktop analysis tool designed specifically for analyzing semiconductor test data to determine the optimum test plan for reducing test time using Pintail’s SwifTest family of on-line, Adaptive Test software. It is a new product replacing Pintails’ original TestVision product originally introduced in 2003. TestVision/6 is offered to Pintail customers for no charge.
Data Browser is a powerful utility for quickly viewing data one lot at a time. This tool is valuable when making final judgments about test time optimization or outlier extraction planning. It may be opened during any of the following analyses. The data browser can import STDF and TEDS formats and can be extended to handle any data format. Contact Pintail for information on other data formats you might use.
Test Time Optimization: TestVision/6 enables to the user to rapidly analyze a large set of test data and determine the recommended test plan for SPC sampling using SwifTest-TTO. Simulation using the same sampling engine in SwifTest-TTO may be performed. A comprehensive report is easily produced for management and engineering review.
Parts Average Testing: TestVision/6 assists the user in determining how to best configure outlier detection and extraction. The tool allows the user to simulate what will happen in production using SwifTest-FOX (Fast Outlier Extraction) in terms of the trade-offs between minimizing potential field defects and avoiding unnecessary yield losses. Pintail supports several other advanced outlier detection algorithms beyond dynamic PAT.
Device Profile Editor: TestVision/6 also makes it easy for users of SwifTest to create and edit their Device Profiles. The Device Profile contains user variables that direct the behavior of SwifTest when it performs test time reduction or outlier extraction. The Device Profile is used by SwifTest once a test program is released to production for adaptive test applications.
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